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Microscopy

Microscopy

Crackling noise technique listens to nanoquakes in materials

28 Sep 2023 Isabelle Dumé
Photo of a person using a microscope, bathed in blue light
Sensitive instrument: The scanning probe microscope (SPM) in Jan Seidel’s group at UNSW, Sydney, used to study novel and 2D materials. (Courtesy: FLEET)
A new microscopy technique to measure “crackling noise” on the nanoscale could have a wide range

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Isabelle Dumé is a contributing editor to Physics World
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