Scanning transmission electron microscopy (STEM) images of columns of aluminium, boron and nitrogen atoms as they move in response to an electric field. Left: In-situ experimental STEM images. Right: Predicted behaviour based on first-principles calculations. (Courtesy: Carnegie Mellon College of Engineering)
A new family of ferroelectric materials could be used to make more energy-efficient microelectronics
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Isabelle Dumé
is a contributing editor to Physics World